Cite
HARVARD Citation
Das, N. et al. (2013). Built‐in‐self‐test technique for diagnosis of delay faults in cluster‐based field programmable gate arrays. IET computers & digital techniques. 7 (5), pp. 210-220. [Online].
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Das, N. et al. (2013). Built‐in‐self‐test technique for diagnosis of delay faults in cluster‐based field programmable gate arrays. IET computers & digital techniques. 7 (5), pp. 210-220. [Online].