Simplified fault‐tolerant FIR filter architecture based on redundant residue number system. Issue 23 (1st November 2014)

• Record Type: Journal Article
• Authors: Luan, Zhibin; Chen, Xiang; Ge, Ning; Wang, Zhaocheng
• Is Part Of: Electronics letters. Volume 50:Issue 23(2014)
• Page Start: 1768
• Page End: 1770
• Publication Date: 2014-11-01
• Subjects: FIR filters -- residue number systems -- radiation hardening (electronics); low‐cost fault‐tolerant finite impulse response filter -- fault‐tolerant FIR filter -- logic resources -- redundant residue number system -- RRNS -- soft errors -- single event upset -- SEU -- three‐moduli set residue to binary converter -- RTBC -- Chinese remainder theorem -- CRT -- small‐sized first‐in–first‐out -- FIFO -- rollback operations -- fault injections; Electronics -- Periodicals; 621.381
• DOI: 10.1049/el.2014.3508
• Languages: English
• ISSNs: 0013-5194

Abstract

Abstract : A low‐cost fault‐tolerant finite impulse response (FIR) filter is presented to save logic resources. Based on the redundant residue number system (RRNS), it eliminates soft errors generated by single event upset (SEU) in space applications, which requires only one three‐moduli set residue to binary converter based on the Chinese remainder theorem. When a soft error happens, only one small‐sized first‐in–first‐out and rollback operations are needed to refresh the FIR filter corrupted by SEU. Theoretical analysis and fault injections are performed to validate that there is no fault missing event. In addition, the proposed scheme can save 21% cell area compared with the conventional RRNS method.