Cite
HARVARD Citation
Sahoo, A. et al. (2015). Pulsed radio frequency characterisation on 28 nm complementary metal–oxide semiconductor technology. Electronics letters. 51 (1), pp. 71-72. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Sahoo, A. et al. (2015). Pulsed radio frequency characterisation on 28 nm complementary metal–oxide semiconductor technology. Electronics letters. 51 (1), pp. 71-72. [Online].