Cite
HARVARD Citation
Tang, S. et al. (2021). Investigation of the passivation-induced VTH shift in p-GaN HEMTs with Au-free gate-first process. Microelectronics and reliability. p. . [Online].
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Tang, S. et al. (2021). Investigation of the passivation-induced VTH shift in p-GaN HEMTs with Au-free gate-first process. Microelectronics and reliability. p. . [Online].