Crystallinity Improvement of ZnO Thin Film on Different Buffer Layers Grown by MBE. (10th May 2012)

• Record Type: Journal Article
• Authors: Ting, Shao-Ying; Chen, Po-Ju; Wang, Hsiang-Chen; Liao, Che-Hao; Chang, Wen-Ming; Hsieh, Ya-Ping; Yang, C. C.
• Other Names: Sczancoski J. C. Academic Editor.
• Is Part Of: Journal of nanomaterials. Volume 2012(2012)
• Publication Date: 2012-05-10
• Subjects: Nanostructured materials -- Periodicals; Nanotechnology -- Periodicals; Nanomatériaux; Nanostructured materials; Nanotechnology; Nanostructures; Nanotechnology; Periodicals; Fulltext; Internet Resources; Periodicals; 620.115
• DOI: 10.1155/2012/929278
• Languages: English
• ISSNs: 1687-4110

Abstract

Abstract : The material and optical properties of ZnO thin film samples grown on different buffer layers on sapphire substrates through a two-step temperature variation growth by molecular beam epitaxy were investigated. The thin buffer layer between the ZnO layer and the sapphire substrate decreased the lattice mismatch to achieve higher quality ZnO thin film growth. A GaN buffer layer slightly increased the quality of the ZnO thin film, but the threading dislocations still stretched along the c -axis of the GaN layer. The use of MgO as the buffer layer decreased the surface roughness of the ZnO thin film by 58.8% due to the suppression of surface cracks through strain transfer of the sample. From deep level emission and rocking curve measurements it was found that the threading dislocations play a more important role than oxygen vacancies for high-quality ZnO thin film growth.