Study of the monte–carlo fault injection simulator to measure a fault derating. Issue 3 (21st January 2019)

• Record Type: Journal Article
• Authors: Lee, Dong‐Woo; Na, Jong‐Whoa
• Is Part Of: IET computers & digital techniques. Volume 13:Issue 3(2019)
• Page Start: 218
• Page End: 223
• Publication Date: 2019-01-21
• Subjects: Monte Carlo methods -- motion compensation -- logic design -- integrated circuit design -- hardware description languages -- integrated circuit testing -- logic testing -- fault simulation -- radiation detection; fault derating -- selected circuits -- radiation tests -- accelerated Monte–Carlo fault injection method -- slow execution time problem -- modified simulator -- fault‐injection campaign -- ITC99 benchmark circuits -- accurate logical derating rate value -- MCFI method -- Verilog procedural interface -- ISCAS85; Computers -- Periodicals; Digital electronics -- Periodicals; Computer engineering -- Periodicals; Computer architecture -- Periodicals; Computer organization -- Periodicals; 621.39
• DOI: 10.1049/iet-cdt.2018.5009
• Languages: English
• ISSNs: 1751-8601

Abstract

Abstract : The SER of the selected circuits can be determined via radiation tests. However, the time and costs required to perform radiation tests are prohibitive. Here, the authors introduce an accelerated Monte–Carlo fault injection (MCFI) method that can solve the slow execution time problem of the previous MCFI method using a modified simulator that uses the Verilog Procedural Interface (VPI). To demonstrate the performance of authors' accelerated MCFI tool, the authors perform a fault‐injection campaign using the ISCAS85 and ITC99 benchmark circuits. Compared with the results from previous studies, the authors obtain an accurate logical derating rate value with a 3% variance, and the authors accelerate the execution time by 20 times or more.