Static test compaction for mixed broadside and skewed‐load transition fault test sets. Issue 1 (1st January 2013)

• Record Type: Journal Article
• Authors: Pomeranz, Irith
• Is Part Of: IET computers & digital techniques. Volume 7:Issue 1(2013)
• Page Start: 21
• Page End: 28
• Publication Date: 2013-01-01
• Subjects: circuit testing -- fault diagnosis; mixed test sets -- static test compaction procedure -- standard‐scan circuits -- improved delay fault coverage -- broadside transition fault test sets -- skewed‐load transition fault test sets; Computers -- Periodicals; Digital electronics -- Periodicals; Computer engineering -- Periodicals; Computer architecture -- Periodicals; Computer organization -- Periodicals; 621.39
• DOI: 10.1049/iet-cdt.2012.0081
• Languages: English
• ISSNs: 1751-8601

Abstract

Abstract : Test sets that consist of both broadside and skewed‐load tests provide improved delay fault coverage for standard‐scan circuits. This study describes a static test compaction procedure for such test sets. The unique feature of the procedure is that it can modify the type of a test (from broadside to skewed‐load or from skewed‐load to broadside) if this contributes to test compaction. Given a test set W, the basic static test compaction procedure described in this study considers for inclusion in the compacted test set both a broadside and a skewed‐load test based on every test w ∈ W . It selects the test type that detects the higher number of faults. An improved procedure considers a broadside and a skewed‐load test based on a test w ∈ W only if w detects a minimum number of faults (without changing its type). Experimental results demonstrate that the static test compaction procedure is typically able to reduce the sizes of mixed test sets further than a procedure that does not modify test types. The procedure modifies the types of significant numbers of tests before including them in the compacted test set.