Improved hybrid scrubbing scheme for spaceborne static random access memory‐based field programmable gate arrays. Issue 19 (17th July 2019)

• Record Type: Journal Article
• Authors: Li, Yue; Chen, Zhichun; Shen, Yuyao; Wang, Yongqing
• Is Part Of: Journal of engineering. Volume 2019:Issue 19(2019)
• Page Start: 6024
• Page End: 6027
• Publication Date: 2019-07-17
• Subjects: error detection -- field programmable gate arrays -- SRAM chips; improved hybrid scrubbing scheme -- spaceborne static random access memory‐based field programmable gate arrays -- shrinking feature sizes -- multiple‐cell upsets -- conventional hybrid scrubbing scheme -- error detection process -- error correction object -- continuous error detection -- erroneous zone correction -- FPGA; Engineering -- Periodicals; Engineering; Electronic journals; Periodicals; 620.005
• DOI: 10.1049/joe.2019.0049
• Languages: English
• ISSNs: 2051-3305

Abstract

Abstract : With the shrinking feature sizes of static random access memory‐based field programmable gate arrays (FPGAs), the occurrence probability of multiple‐cell upsets (MCUs) in FPGAs continues to increase. This reduces the reliability of FPGAs. This article proposes an improved hybrid scrubbing scheme to solve this problem. Based on the conventional hybrid scrubbing scheme, the error detection process is improved by changing the error correction object from an erroneous frame to an erroneous zone. MCUs can be rapidly corrected through continuous error detection and erroneous zone correction. The theoretical analysis and implementation results show that the improved hybrid scrubbing scheme can effectively reduce the average repair time of MCU errors.