Cite
HARVARD Citation
Liu, Q. et al. (2018). Dynamic concurrent kernel CCA for strip-thickness relevant fault diagnosis of continuous annealing processes. Journal of process control. pp. 12-22. [Online].
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Liu, Q. et al. (2018). Dynamic concurrent kernel CCA for strip-thickness relevant fault diagnosis of continuous annealing processes. Journal of process control. pp. 12-22. [Online].