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HARVARD Citation
Borowicz, P. et al. (2013). Raman Spectra of High-κ Dielectric Layers Investigated with Micro-Raman Spectroscopy Comparison with Silicon Dioxide. TheScientificWorldjournal. p. . [Online].
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Borowicz, P. et al. (2013). Raman Spectra of High-κ Dielectric Layers Investigated with Micro-Raman Spectroscopy Comparison with Silicon Dioxide. TheScientificWorldjournal. p. . [Online].