Near-Edge X-Ray Absorption Fine Structure of Ultrananocrystalline Diamond/Hydrogenated Amorphous Carbon Films Prepared by Pulsed Laser Deposition. (7th June 2009)

• Record Type: Journal Article
• Authors: Ohmagari, Shinya; Yoshitake, Tsuyoshi; Nagano, Akira; AL-Riyami, Sausan; Ohtani, Ryota; Setoyama, Hiroyuki; Kobayashi, Eiichi; Nagayama, Kunihito
• Other Names: Joshi Rakesh Academic Editor.
• Is Part Of: Journal of nanomaterials. Volume 2009(2009)
• Publication Date: 2009-06-07
• Subjects: Nanostructured materials -- Periodicals; Nanotechnology -- Periodicals; Nanomatériaux; Nanostructured materials; Nanotechnology; Nanostructures; Nanotechnology; Periodicals; Fulltext; Internet Resources; Periodicals; 620.115
• DOI: 10.1155/2009/876561
• Languages: English
• ISSNs: 1687-4110

Abstract

Abstract : The atomic bonding configuration of ultrananocrystalline diamond (UNCD)/hydrogenated amorphous carbon (a-C:H) films prepared by pulsed laser ablation of graphite in a hydrogen atmosphere was examined by near-edge X-ray absorption fine structure spectroscopy. The measured spectra were decomposed with simple component spectra, and they were analyzed in detail. As compared to the a-C:H films deposited at room substrate-temperature, the UNCD/a-C:H and nonhydrogenated amorphous carbon (a-C) films deposited at a substrate-temperature of 550 ∘ C exhibited enhanced π ∗ and σ ∗ C ≡ C peaks. At the elevated substrate-temperature, the π ∗ and σ ∗ C ≡ C bonds formation is enhanced while the σ ∗ C–H and σ ∗ C–C bonds formation is suppressed. The UNCD/a-C:H film showed a larger σ ∗ C–C peak than the a-C film deposited at the same elevated substrate-temperature in vacuum. We believe that the intense σ ∗ C–C peak is evidently responsible for UNCD crystallites existence in the film.