Si 1s−1, 2s−1 and 2p−1 lifetime broadening of SiX4 (X = F, Cl, Br, CH3) molecules: SiF4 anomalous behaviour reassessed. Issue 17 (11th April 2019)

• Record Type: Journal Article
• Authors: Püttner, Ralph; Marchenko, Tatiana; Guillemin, Renaud; Journel, Loïc; Goldsztejn, Gildas; Céolin, Denis; Takahashi, Osamu; Ueda, Kiyoshi; Lago, Alexsandre F.; Piancastelli, Maria Novella; Simon, Marc
• Is Part Of: Physical chemistry chemical physics. Volume 21:Issue 17(2019)
• Page Start: 8827
• Page End: 8836
• Publication Date: 2019-04-11
• Subjects: Chemistry, Physical and theoretical -- Periodicals; 541.3
• DOI: 10.1039/c8cp07369d
• Languages: English
• ISSNs: 1463-9076

Abstract

Abstract : The Si 2s and 2p core holes of SiF4 show significant non-local electronic decays like ICD, ETMD2 and ETMD3. Abstract : The Si 1s −1, Si 2s −1, and Si 2p −1 photoelectron spectra of the SiX4 molecules with X = F, Cl, Br, CH3 were measured. From these spectra the Si 1s −1 and Si 2s −1 lifetime broadenings were determined, revealing a significantly larger value for the Si 2s −1 core hole of SiF4 than for the same core hole of the other molecules of the sequence. This finding is in line with the results of the Si 2p −1 core holes of a number of SiX4 molecules, with an exceptionally large broadening for SiF4 . For the Si 2s −1 core hole of SiF4 the difference to the other SiX4 molecules can be explained in terms of Interatomic Coulomb Decay (ICD)-like processes. For the Si 2p −1 core hole of SiF4 the estimated values for the sum of the Intraatomic Auger Electron Decay (IAED) and ICD-like processes are too small to explain the observed linewidth. However, the results of the given discussion render for SiF4 significant contributions from Electron Transfer Mediated Decay (ETMD)-like processes at least plausible. On the grounds of our results, some more molecular systems in which similar processes can be observed are identified.