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HARVARD Citation
Mukundan, V. et al. (2021). Ferroelectric Phase Content in 7 nm Hf(1−x)ZrxO2 Thin Films Determined by X‐Ray‐Based Methods. Physica status solidi. 218 (10), p. n/a. [Online].
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Mukundan, V. et al. (2021). Ferroelectric Phase Content in 7 nm Hf(1−x)ZrxO2 Thin Films Determined by X‐Ray‐Based Methods. Physica status solidi. 218 (10), p. n/a. [Online].