Accurate and dynamic 3D shape measurement with digital image correlation-assisted phase shifting. (30th April 2021)

• Record Type: Journal Article
• Authors: Hu, Pengyu; Yang, Shuming; Zheng, Fenghe; Yuan, Ye; Wang, Teng; Li, Shusheng; Liu, Haibao; Dear, John P
• Is Part Of: Measurement science & technology. Volume 32:Number 7(2021)
• Publication Date: 2021-04-30
• Subjects: 3D shape measurement -- structured-light -- phase shifting profilometry -- digital image correlation -- stereo vision; Physical measurements -- Periodicals; Scientific apparatus and instruments -- Periodicals; Equipment and Supplies -- Periodicals; Science -- instrumentation -- Periodicals; Technology -- instrumentation -- Periodicals; Mesures physiques -- Périodiques; Physical measurements; Scientific apparatus and instruments; Periodicals; 502.87
• DOI: 10.1088/1361-6501/abddf2
• Languages: English
• ISSNs: 0957-0233

Abstract

Abstract: Phase-shifting profilometry (PSP) has been widely used in structured-light (SL) systems for three-dimensional (3D) shape measurements, but the speed of the PSP technique is limited by increased phase-shifting patterns. This paper proposes an accurate and dynamic 3D shape measurement method by projecting only four patterns, including three-step phase-shifting patterns and one speckle pattern. Three-step phase-shifting images are used to obtain the initial unwrapped phase map with phase ambiguity. Based on the principle of digital image correlation and multi-view geometry, the absolute phase can be recovered reliably without requiring any embedded features or pre-defined information of the object. To improve the measurement accuracy, the projector coordinate is used as the measuring coordinate to establish a novel stereo SL system model. By solving a least square solution using the triple-view information, accurate 3D surface data can be reconstructed. The experimental results indicate that the proposed method can perform high-speed and accurate 3D shape measurements with an accuracy of 10.64 μm, which is superior to conventional methods and has certain instructive significance for 3D profilometry and measurement engineering.