Cite
HARVARD Citation
Povstugar, I. et al. (2019). Correlative Atom Probe Tomography and Transmission Electron Microscopy Analysis of Grain Boundaries in Thermally Grown Alumina Scale. Microscopy and microanalysis. pp. 11-20. [Online].
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Povstugar, I. et al. (2019). Correlative Atom Probe Tomography and Transmission Electron Microscopy Analysis of Grain Boundaries in Thermally Grown Alumina Scale. Microscopy and microanalysis. pp. 11-20. [Online].