Cite
HARVARD Citation
Kaspar, T. et al. (2021). Bulk and Short‐Circuit Anion Diffusion in Epitaxial Fe2O3 Films Quantified Using Buried Isotopic Tracer Layers. Advanced materials interfaces. 8 (9), p. n/a. [Online].
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Kaspar, T. et al. (2021). Bulk and Short‐Circuit Anion Diffusion in Epitaxial Fe2O3 Films Quantified Using Buried Isotopic Tracer Layers. Advanced materials interfaces. 8 (9), p. n/a. [Online].