Implementation of highly optimized optical all logic gates on a single chip using Ti-diffused lithium-niobate for high-speed processing in combinational circuits. (May 2021)

• Record Type: Journal Article
• Authors: Choudhary, Kuldeep; Singh, Ashutosh; Singh, Aditya; Chaudhary, Dhruva; Kumar, Santosh
• Is Part Of: Microelectronics journal. Volume 111(2021)
• Publication Date: 2021-05
• Subjects: Ti-diffused lithium niobate -- Mach-Zehnder interferometer -- Optical all logic devices -- Extinction ratio -- Beam propagation method -- Insertion loss; Microelectronics -- Periodicals; Microélectronique -- Périodiques; Microelectronics; Electronic journals; Journals - contents and abstracts; Periodicals; 621.3805
• DOI: 10.1016/j.mejo.2021.105048
• Languages: English
• ISSNs: 0959-8324

Abstract

Abstract: In the proposed work, we have implemented all logic gates (AND, OR, NOR, NAND, Ex-OR, and Ex-NOR) on a single chip by utilizing the Ti-Diffused lithium niobate (Ti-LiNbO3 ) based Mach-Zehnder Interferometers. Earlier, many separate photonic devices were developed for individual logic gates. But, proposed gates are highly optimized for high-speed processing combinational circuits by their uniqueness as a single device for all-logic gates. The Beam propagation method (BPM) is acclimated for modeling, study and simulation of the proposed structure. This macrocosmic design can handle immensely colossal combinational circuits with high-speed processing. An insertion loss of 0.83 ​dB and an extinction ratio (ER) of 9.01 ​dB are reported. The simulated results are verified utilizing mathematical computation and MATLAB simulation.