Biosynthesis and characterisation of zinc oxide nanoparticles from Punica granatum (pomegranate) juice extract and its application in thin films preparation by spin‐coating method. (27th May 2020)

• Record Type: Journal Article
• Authors: Barzinjy, Azeez Abdullah; Hamad, Samir Mustafa; Esmaeel, Mahera Muhsin; Aydın, Semih Khurshid; Hussain, Faiq Hama Saeed
• Is Part Of: Micro & nano letters. Volume 15:Number 6(2020)
• Page Start: 415
• Page End: 420
• Publication Date: 2020-05-27
• Subjects: nanofabrication -- spin coating -- field emission electron microscopy -- zinc compounds -- nanoparticles -- semiconductor growth -- surface morphology -- ultraviolet spectra -- X‐ray chemical analysis -- crystal structure -- energy gap -- wide band gap semiconductors -- silicon -- II‐VI semiconductors -- visible spectra -- X‐ray diffraction -- scanning electron microscopy -- Fourier transform infrared spectra -- semiconductor thin films; coated ZnO NPs -- homogeneous thin film -- crystal structure -- field‐emission scanning electron microscopy -- wurtzite structure -- zinc oxide nanoparticles -- punica granatum juice -- pomegranate -- spin coating method -- zinc oxide thin film -- p‐type silicon wafer -- efficient chelating -- capping agent -- surface morphology -- optical characteristics -- X‐ray diffraction -- UV‐visible spectra -- photovoltaic material -- electron volt energy 3.41 eV -- ZnO -- Si; Nanotechnology -- Periodicals; Nanostructures -- Periodicals; Microtechnology -- Periodicals; 620.5
• DOI: 10.1049/mnl.2019.0501
• Languages: English
• ISSNs: 1750-0443

Abstract

Abstract : In this work, zinc oxide (ZnO) thin film has been assembled through the spin‐coating method and accumulated on the p‐type silicon (100) wafer. The ZnO nanoparticles (NPs) prepared via an entirely green procedure using Punica granatum (pomegranate) juice extract as an efficient chelating and capping agent. The coated ZnO NPs exhibited a homogeneous thin film over the silicon wafer. The crystal structure, surface morphology, alignment, and optical characteristics of ZnO thin film were studied through X‐ray diffraction, field‐emission scanning electron microscopy, EDX analysis, infrared spectroscopy, in addition to UV–vis spectra, correspondingly. The structure of the ZnO thin film was indexed as a wurtzite structure. UV–vis spectroscopy reveals that the alteration is straight bandgap energy ( E g ) and it is precisely 3.41 eV. The acquired ZnO thin films conceivably utilised as a photovoltaic material. The IR absorbance spectra indicate that the ZnO NPs spin‐coated on the Si substrate improves the crystalline quality.