Induced‐transparency in silicon‐on‐insulator based novel resonator systems. (1st October 2013)

• Record Type: Journal Article
• Authors: Cui, Danfeng; Wei, Liping; Liu, Chao; Liu, Yaoying; Wang, Yonghua; Liu, Jun; Xue, Chenyang
• Is Part Of: Micro & nano letters. Volume 8:Number 10(2013)
• Page Start: 619
• Page End: 622
• Publication Date: 2013-10-01
• Subjects: optical resonators -- Q‐factor -- self‐induced transparency -- silicon‐on‐insulator; silicon‐on‐insulator -- coupled‐resonator‐induced‐transparency phenomenon -- optical resonator system -- four‐ring resonator -- transparency peak -- group velocity -- CRIT effect -- optical coupled‐resonator -- classical destructive interference -- CRIT resonance -- quality factor -- cavity size -- power coupling -- drop transmission spectra -- resonant wavelength -- size 20 mum -- Si; Nanotechnology -- Periodicals; Nanostructures -- Periodicals; Microtechnology -- Periodicals; 620.5
• DOI: 10.1049/mnl.2013.0232
• Languages: English
• ISSNs: 1750-0443

Abstract

Abstract : The coupled‐resonator‐induced‐transparency (CRIT) phenomenon in a novel optical resonator system is experimentally demonstrated. The system is composed of a four‐ring resonator with a 20 μm diameter on silicon, whose spectrum has a narrow transparency peak with low group velocity. The CRIT effect is observed in the optical coupled‐resonator because of classical destructive interference. In this reported work, a CRIT resonance with a quality factor of 7.2 × 10 4 is demonstrated with the same cavity size and the power coupling of the system is 60%, which agree well with the theoretical analysis. Then, through and drop transmission spectra of the resonator coincide well with each other. Simultaneously, the detuning resonant wavelength can be controlled by changing the temperature.