Conduction mechanisms in metal/self‐assembled monolayer/metal junctions. (26th June 2019)

• Record Type: Journal Article
• Authors: Etor, David; Dodd, Linzi E.; Balocco, Claudio; Wood, David
• Is Part Of: Micro & nano letters. Volume 14:Number 7(2019)
• Page Start: 808
• Page End: 811
• Publication Date: 2019-06-26
• Subjects: MIM devices -- self‐assembly -- tunnelling -- Poole‐Frenkel effect -- Green's function methods -- monolayers -- MIM structures; higher temperatures surface -- bulk‐limited mechanisms -- direct (Simmons) tunnelling -- conduction mechanisms -- metal–insulator–metal junctions -- temperature dependence measurements -- metal‐self‐assembled monolayer‐metal junctions -- temperature dependence -- surface‐limited mechanisms -- Schottky emission -- Poole–Frenkel theory -- numerical simulations -- non‐equilibrium Green‐function formalism -- temperature 2.5 K to 300.0 K; Nanotechnology -- Periodicals; Nanostructures -- Periodicals; Microtechnology -- Periodicals; 620.5
• DOI: 10.1049/mnl.2018.5747
• Languages: English
• ISSNs: 1750-0443

Abstract

Abstract : The conduction mechanisms in metal–insulator–metal junctions where the insulator consists of a self‐assembled monolayer are investigated. Temperature dependence measurements from 2.5 to 300 K, show that the conduction is dominated by tunnelling only for temperatures below 20 K, while at higher temperatures surface‐limited and bulk‐limited mechanisms are observed. The experimental results are explained using a combination of direct (Simmons) tunnelling, Schottky emission, and Poole–Frenkel theory. Further insight is gained through numerical simulations based on the non‐equilibrium Green‐function formalism.