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HARVARD Citation
Shen, J. et al. (2020). Defect detection of printed circuit board based on lightweight deep convolution network. IET image processing. 14 (15), pp. 3932-3940. [Online].
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Shen, J. et al. (2020). Defect detection of printed circuit board based on lightweight deep convolution network. IET image processing. 14 (15), pp. 3932-3940. [Online].