Inside Front Cover: Imaging Secondary Electron Emission from a Single Atomic Layer (Small Methods 4/2021). Issue 4 (14th April 2021)

• Record Type: Journal Article
• Authors: Dyck, Ondrej; Swett, Jacob L.; Lupini, Andrew R.; Mol, Jan A.; Jesse, Stephen
• Is Part Of: Small methods. Volume 5:Issue 4(2021)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2021-04-14
• Subjects: graphene -- scanning transmission electron microscopy -- secondary electron e‐beam induced current -- secondary electron yield; Nanotechnology -- Methodology -- Periodicals; Nanotechnology -- Periodicals; Periodicals; 620.5028
• DOI: 10.1002/smtd.202170013
• Languages: English
• ISSNs: 2366-9608

Abstract

Abstract : In article number 2000950 by Ondrej Dyck and co‐workers, operando prototype graphene devices are examined with a scanning transmission electron microscope. Secondary electron e‐beam induced current (SEEBIC) is used to detect a single layer of graphene and distinguish different layer numbers. SEEBIC imaging offers a complementary view into electrical conductivity and connectivity with high spatial resolution.