Built‐in self‐test structure for fault detection of charge‐pump phase‐locked loop. Issue 4 (1st July 2016)

• Record Type: Journal Article
• Authors: Xia, Lanhua; Wu, Jianhui; Huang, Cheng; Zhang, Meng
• Is Part Of: IET circuits, devices & systems. Volume 10:Issue 4(2016)
• Page Start: 317
• Page End: 321
• Publication Date: 2016-07-01
• Subjects: charge pump circuits -- phase locked loops -- built-in self test -- phase detectors -- flip-flops; charge pump phase locked loop -- fault detection -- defect-oriented built-in self-test structure -- BIST structure -- overhead test solution -- phase detector -- frequency detector -- D flip-flop -- stimulus generator -- feature extracted devices -- fault simulation -- fault coverage; Electronic circuits -- Periodicals; Electronic systems -- Periodicals; 621.381505
• DOI: 10.1049/iet-cds.2015.0224
• Languages: English
• ISSNs: 1751-858X

Abstract

Abstract : A defect‐oriented built‐in self‐test (BIST) structure of charge‐pump phase‐locked loop (CP‐PLL) for high fault coverage and low area overhead test solution is proposed. It employs a new structure of phase/frequency detector, a D flip‐flop and some existing blocks in the PLL as the input stimulus generator and fault feature extracted devices for testing evaluation. Thus, no extra test stimulus or high‐performance measured instruments are required for test. The structure is easily implemented and has a little influence on the performance of CP‐PLL. Fault simulation results indicate that the proposed BIST structure has high fault coverage (98.75%) and low area overhead (0.78%).