Cite
HARVARD Citation
Li, X. et al. (2013). Reducing the number of sensors under hot spot temperature error bound for microprocessors based on dual clustering. IET circuits, devices & systems. 7 (4), pp. 211-220. [Online].
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Li, X. et al. (2013). Reducing the number of sensors under hot spot temperature error bound for microprocessors based on dual clustering. IET circuits, devices & systems. 7 (4), pp. 211-220. [Online].