Losses do not prevent wide band metamaterial true time delay line applications, GaAs MMIC experimental verification. Issue 11 (19th May 2020)

• Record Type: Journal Article
• Authors: Herbette, Quentin; Géron, Emmanuel; Dichi, Thierry; Pillet, Grégoire; Lucas, Jerome
• Is Part Of: IET microwaves, antennas & propagation. Volume 14:Issue 11(2020)
• Page Start: 1180
• Page End: 1184
• Publication Date: 2020-05-19
• Subjects: delay lines -- MMIC -- gallium arsenide -- III‐V semiconductors -- microwave metamaterials -- impedance matching; ohmics losses -- impedance mismatch -- low insertion losses -- low return loss -- tunable delay -- impairing feature -- metamaterial true time delay line devices -- wideband metamaterial time delay line applications -- MMIC experimental verification -- radar systems -- GaAs; Microwaves -- Periodicals; Microwave antennas -- Periodicals; Antennas (Electronics) -- Periodicals; Radio wave propagation -- Periodicals; Microwave communication systems -- Periodicals; 621.381305
• DOI: 10.1049/iet-map.2019.0546
• Languages: English
• ISSNs: 1751-8725

Abstract

Abstract : Losses are often the impairing feature of metamaterial true time delay line devices. In this study, the authors analytically demonstrate that ohmics losses in this kind of structures as well as impedance mismatch depend on the bandwidth. These results allow to consider wide band application for radar systems. It is verified experimentally that metamaterial delay line devices are fitted for wide band delay line applications for they allow low insertion losses, low return loss and tunable delay.