Valid angle criterion and radiation pattern estimation via singular value decomposition for planar scanning. Issue 13 (30th July 2019)

• Record Type: Journal Article
• Authors: Maisto, Maria Antonia; Solimene, Raffaele; Pierri, Rocco
• Is Part Of: IET microwaves, antennas & propagation. Volume 13:Issue 13(2019)
• Page Start: 2342
• Page End: 2348
• Publication Date: 2019-07-30
• Subjects: aperture antennas -- antenna radiation patterns -- Fourier transforms -- singular value decomposition -- antenna testing -- planar antennas; valid angle criterion -- radiation pattern estimation -- singular value decomposition -- planar scanning -- planar near‐field antenna measurement techniques -- observation aperture -- valid angle concept -- far‐field pattern -- aperture antenna size -- VA criterion -- radiation operator -- radiation pattern representation -- radiation pattern representation; Microwaves -- Periodicals; Microwave antennas -- Periodicals; Antennas (Electronics) -- Periodicals; Radio wave propagation -- Periodicals; Microwave communication systems -- Periodicals; 621.381305
• DOI: 10.1049/iet-map.2018.5240
• Languages: English
• ISSNs: 1751-8725

Abstract

Abstract : Planar near‐field antenna measurement techniques are addressed with particular reference to the error in the radiation pattern estimation due to the finiteness of the observation aperture. The valid angle (VA) concept is a commonly used rule‐of‐thumb for predicting the region of validity of the calculated far‐field pattern according to observation domain, the aperture antenna size and the distance between the two. However, it is based on simple asymptotic arguments which often lead to erroneous estimations. In this contribution, a new VA criterion and related radiation pattern representation are derived by exploiting the singular value decomposition of the radiation operator. Numerical examples show the goodness of the new VA criterion and the greatest stability of the proposed radiation pattern estimation compared to the classical Fourier transform.