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HARVARD Citation
Wang, A. et al. (2015). A New Process Industry Fault Diagnosis Algorithm Based on Ensemble Improved Binary‐Tree SVM. Chinese journal of electronics. 24 (2), pp. 258-262. [Online].
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Wang, A. et al. (2015). A New Process Industry Fault Diagnosis Algorithm Based on Ensemble Improved Binary‐Tree SVM. Chinese journal of electronics. 24 (2), pp. 258-262. [Online].