Fault Analysis on a New Block Cipher DBlock with at Most Two Fault Injections. Issue 6 (1st November 2018)
- Record Type:
- Journal Article
- Title:
- Fault Analysis on a New Block Cipher DBlock with at Most Two Fault Injections. Issue 6 (1st November 2018)
- Main Title:
- Fault Analysis on a New Block Cipher DBlock with at Most Two Fault Injections
- Authors:
- Feng, Jingyi
Chen, Hua
Gao, Si
Cao, Weiqiong
Fan, Limin
Zhu, Shaofeng - Abstract:
- Abstract : DBlock is a new family of block ciphers proposed by Wu et al. in Science China in 2015, which consists of three variants specified as DBlock‐128/192/256. DBlock‐ n employs a 20‐round Feistel‐type structure with n ‐bit block size and n ‐bit key size. We propose the first fault analysis on DBlock and show that no more than 2 pairs of correct/faulty ciphertexts are needed to retrieve the master key. In the attack, a byte‐oriented fault is injected in round 16, and three properties including diffierential distribution of the Sbox, bijection nature of the linear function and Feistel‐type key scheduling are fully utilized to distinguish between the correct and wrong keys. A fault position guessing strategy based on known intermediates is adopted, which efficiently makes the known‐fault attack apply to the random fault model. The experimental results show that, with a pair of ciphertexts, 11.820‐bit exhaustive search is needed to derive the whole 128‐bit key on average. With 2 pairs of ciphertexts, the unique key can be determined within 6.5 minutes.
- Is Part Of:
- Chinese journal of electronics. Volume 27:Issue 6(2018)
- Journal:
- Chinese journal of electronics
- Issue:
- Volume 27:Issue 6(2018)
- Issue Display:
- Volume 27, Issue 6 (2018)
- Year:
- 2018
- Volume:
- 27
- Issue:
- 6
- Issue Sort Value:
- 2018-0027-0006-0000
- Page Start:
- 1277
- Page End:
- 1282
- Publication Date:
- 2018-11-01
- Subjects:
- Fault analysis -- Random fault model -- Block cipher -- DBlock
cryptography
fault analysis -- fault injections -- n‐bit block size -- master key -- byte‐oriented fault -- bijection nature -- Feistel‐type key scheduling -- known‐fault attack -- random fault model -- unique key -- fault position guessing strategy -- Feistel‐type structure -- block cipher DBlock -- differential distribution -- time 6.5 min -- storage capacity 128 bit
Electronics -- Periodicals
Electronics -- China -- Periodicals
Electronics
China
Periodicals
621.38105 - Journal URLs:
- https://ietresearch.onlinelibrary.wiley.com/journal/20755597 ↗
http://ieeexplore.ieee.org/servlet/opac?punumber=7479413 ↗
http://ieeexplore.ieee.org/Xplore/home.jsp ↗ - DOI:
- 10.1049/cje.2018.09.003 ↗
- Languages:
- English
- ISSNs:
- 1022-4653
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 3180.317180
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 16429.xml