Modelling of the effective dielectric constant of planar spoof surface plasmon polariton waveguides. Issue 21 (1st October 2017)

• Record Type: Journal Article
• Authors: Unutmaz, M.A.; Unlu, M.
• Is Part Of: Electronics letters. Volume 53:Issue 21(2017)
• Page Start: 1418
• Page End: 1420
• Publication Date: 2017-10-01
• Subjects: planar waveguides -- surface plasmons -- polaritons -- permittivity -- dielectric waveguides; effective dielectric constant modelling -- planar spoof surface plasmon polariton waveguides -- X‐band frequencies -- single conductor structure -- closed‐form formula -- corrugation depth -- aperture -- periodicity -- substrate material thickness -- permittivity -- worst case error -- frequency 8 GHz to 12 GHz; Electronics -- Periodicals; 621.381
• DOI: 10.1049/el.2017.2360
• Languages: English
• ISSNs: 0013-5194

Abstract

Abstract : The modelling of the effective dielectric constant of a planar spoof surface plasmon polariton waveguide for X‐band frequencies is presented. The waveguide has a single conductor structure that is corrugated on both sides. A methodology to extract the effective dielectric constant of waveguides with complex patterns and a novel closed‐form formula based on complex analysis of the structure and empirical methods are suggested. The suggested formula is a function of the corrugation depth, aperture, periodicity, thickness of the substrate material and permittivity. The worst case error between the formula and measurement result is 8.4%, which is much lower than the previously reported coplanar stripline formulation approach having an error of 14.5%.