Cite
HARVARD Citation
Kher, V. et al. (2020). Probability of defect detection in pulse compression favourable thermal excitation schemes for infra‐red non‐destructive testing. Electronics letters. 56 (19), pp. 998-1000. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Kher, V. et al. (2020). Probability of defect detection in pulse compression favourable thermal excitation schemes for infra‐red non‐destructive testing. Electronics letters. 56 (19), pp. 998-1000. [Online].