Cite
HARVARD Citation
Jordan, J. et al. (2014). Contactless radio frequency probes for high‐temperature characterisation of microwave integrated circuits. Electronics letters. 50 (11), pp. 817-819. [Online].
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Jordan, J. et al. (2014). Contactless radio frequency probes for high‐temperature characterisation of microwave integrated circuits. Electronics letters. 50 (11), pp. 817-819. [Online].