Cite
HARVARD Citation
He, W. et al. (2019). Feature extraction of analogue circuit fault signals via cross‐wavelet transform and variational Bayesian matrix factorisation. IET science, measurement & technology. 13 (2), pp. 318-327. [Online].
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He, W. et al. (2019). Feature extraction of analogue circuit fault signals via cross‐wavelet transform and variational Bayesian matrix factorisation. IET science, measurement & technology. 13 (2), pp. 318-327. [Online].