Yield improvement by redundancy method for component calibration. Issue 13 (1st June 2013)

• Record Type: Journal Article
• Authors: Enikeeva, F.; Morche, D.; Oguz, A.
• Is Part Of: Electronics letters. Volume 49:Issue 13(2013)
• Page Start: 824
• Page End: 826
• Publication Date: 2013-06-01
• Subjects: approximation theory -- calibration; component calibration -- redundant channel methodology -- yield normal approximation improvement; approximation theory -- calibration; component calibration -- redundant channel methodology -- yield normal approximation improvement; Electronics -- Periodicals; 621.381
• DOI: 10.1049/el.2012.4170
• Languages: English
• ISSNs: 0013-5194

Abstract

Abstract : The benefits of a redundant channels methodology for the component calibration are explored. Proposed is a normal approximation of the yield in order to estimate the number of redundant components needed to provide a minimal area occupied by the components.