Fabrication of 45 nm high In component metamorphic In0.7Ga0.3As/In0.6Ga0.4As composite‐channel high electron‐mobility transistors on GaAs substrates. Issue 4 (1st February 2016)
- Record Type:
- Journal Article
- Title:
- Fabrication of 45 nm high In component metamorphic In0.7Ga0.3As/In0.6Ga0.4As composite‐channel high electron‐mobility transistors on GaAs substrates. Issue 4 (1st February 2016)
- Main Title:
- Fabrication of 45 nm high In component metamorphic In0.7Ga0.3As/In0.6Ga0.4As composite‐channel high electron‐mobility transistors on GaAs substrates
- Authors:
- Kang, Weihua
Zhang, Xiaodong
Ji, Xian
Cai, Yong
Zhou, Jiahui
Xu, Wenjun
Li, Qi
Xiao, Gongli
Zhang, Baoshun
Li, Haiou - Abstract:
- Abstract : A 45 nm high In component metamorphic In0.7 Ga0.3 As/In0.6 Ga0.4 As composite‐channel high electron‐mobility transistor (mHEMT) on GaAs substrate with good DC and RF performance has been developed. The structure was grown by molecular beam epitaxy and exhibits a superior electron mobility of 10200 cm 2 /(V.s) and a sheet density of 3.5 × 1012 cm −2 at a room temperature. A combined optical and e‐beam lithography technology was used to achieve the nanometre mHEMT device. The mHEMT device shows an extrinsic transconductance of up to 990 mS/mm and a maximum current density of 910 mA/mm. The unity current gain cutoff frequency fT and the maximum oscillation frequency f max are 187.94 and 258.62 GHz, respectively. These performances make the device well suited for millimetre‐wave applications.
- Is Part Of:
- Electronics letters. Volume 52:Issue 4(2016)
- Journal:
- Electronics letters
- Issue:
- Volume 52:Issue 4(2016)
- Issue Display:
- Volume 52, Issue 4 (2016)
- Year:
- 2016
- Volume:
- 52
- Issue:
- 4
- Issue Sort Value:
- 2016-0052-0004-0000
- Page Start:
- 318
- Page End:
- 319
- Publication Date:
- 2016-02-01
- Subjects:
- millimetre wave transistors -- high electron mobility transistors -- composite materials -- semiconductor device manufacture -- photolithography -- electron beam lithography -- current density -- molecular beam epitaxial growth -- nanoelectronics -- indium compounds -- III‐V semiconductors
In0.7Ga0.3As‐In0.6Ga0.4As -- frequency 258.62 GHz -- frequency 187.94 GHz -- size 45 nm -- oscillation frequency -- unity current gain cut‐off frequency -- current density -- nanometer mHEMT device -- e‐beam lithography technology -- optical lithography technology -- sheet density -- electron mobility -- molecular beam epitaxy -- high electron‐mobility transistors -- metamorphic composite‐channel
Electronics -- Periodicals
621.381 - Journal URLs:
- http://digital-library.theiet.org/content/journals/el ↗
http://estar.bl.uk/cgi-bin/sciserv.pl?collection=journals&journal=00135194 ↗
https://ietresearch.onlinelibrary.wiley.com/loi/1350911x ↗
http://www.theiet.org/ ↗ - DOI:
- 10.1049/el.2015.2126 ↗
- Languages:
- English
- ISSNs:
- 0013-5194
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 3705.060000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 16448.xml