Complex interaction of passive multiport structures and their description by separate discrete models. Issue 1 (1st January 2016)

• Record Type: Journal Article
• Authors: Ohlrogge, M.; Tessmann, A.; Leuther, A.; Schlechtweg, M.; Ambacher, O.
• Is Part Of: Electronics letters. Volume 52:Issue 1(2016)
• Page Start: 52
• Page End: 54
• Publication Date: 2016-01-01
• Subjects: passive networks -- multiport networks -- S‐parameters -- circuit resonance -- electromagnetic fields -- integrated circuit modelling -- MIMIC -- submillimetre wave integrated circuits; passive multiport structure -- separate discrete model -- T‐junction -- submillimetre wavelength -- stub‐network -- RF‐matching network -- resonance frequency -- S‐parameter measurement -- 3D electromagnetic field simulation -- 3D‐EMFS -- microwave monolithically integrated circuit -- MMIC; Electronics -- Periodicals; 621.381
• DOI: 10.1049/el.2015.2753
• Languages: English
• ISSNs: 0013-5194

Abstract

Abstract : It is demonstrated, using the example of a T‐junction, that not every multiport structure can be accurately described by a discrete and separated modelling approach at millimetre and sub‐millimetre wavelengths. It is shown that especially stub‐networks, which are typically used in RF‐matching networks, are affected. In this case, the discrete modelling approach predicts a different resonance frequency than the S ‐parameter measurement as well as the 3D electromagnetic field simulation (3D‐EMFS) of the whole structure. However, these resonances are of particular importance for the design of a RF matching network and should be predicted by the model as precisely as possible. Therefore, the reason for the mismatch by accurate 3D‐EMFS is investigated and a possible solution on how to model the so‐called complex interactions in passive multiport structures at millimetre and sub‐millimetre wavelengths is provided.