Thru‐reflect‐line calibration for substrate integrated waveguide devices with tapered microstrip transitions. Issue 2 (1st January 2013)

• Record Type: Journal Article
• Authors: Caballero, E. Diaz; Belenguer, A.; Esteban, H.; Boria, V.E.
• Is Part Of: Electronics letters. Volume 49:Issue 2(2013)
• Page Start: 132
• Page End: 133
• Publication Date: 2013-01-01
• Subjects: calibration -- planar waveguides -- waveguide transitions -- substrate integrated waveguides; thru‐reflect‐line calibration -- substrate integrated waveguide devices -- tapered microstrip transitions -- SIW devices -- planar structures; Electronics -- Periodicals; 621.381
• DOI: 10.1049/el.2012.3027
• Languages: English
• ISSNs: 0013-5194

Abstract

Abstract : One of the main problems when exciting or measuring substrate integrated waveguide (SIW) devices lies in the need of a good interconnection with planar structures. In this reported work, the negative effects produced by the connectors and the tapered microstrip‐to‐SIW transitions are de‐embedded from the measurements of the SIW structure by a thru‐reflect‐line calibration with an adequate and cheap SIW calibration kit.