Cite
HARVARD Citation
Yu, B. et al. (2013). Effect and extraction of series resistance in Al2O3‐InGaAs MOS with bulk‐oxide trap. Electronics letters. 49 (7), pp. 492-493. [Online].
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Yu, B. et al. (2013). Effect and extraction of series resistance in Al2O3‐InGaAs MOS with bulk‐oxide trap. Electronics letters. 49 (7), pp. 492-493. [Online].