Augmented kludge waveforms and Gaussian process regression for EMRI data analysis. (May 2016)

• Record Type: Journal Article
• Authors: Chua, Alvin J K
• Is Part Of: Journal of physics. Volume 716(2016)
• Publication Date: 2016-05
• Subjects: Physics -- Congresses; 530.5
• DOI: 10.1088/1742-6596/716/1/012028
• Languages: English
• ISSNs: 1742-6588

Abstract

Abstract: Extreme-mass-ratio inspirals (EMRIs) will be an important type of astrophysical source for future space-based gravitational-wave detectors. There is a trade-off between accuracy and computational speed for the EMRI waveform templates required in the analysis of data from these detectors. We discuss how the systematic error incurred by using faster templates may be reduced with improved models such as augmented kludge waveforms, and marginalised over with statistical techniques such as Gaussian process regression.