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HARVARD Citation
Yun, J. et al. (n.d.). Analysis of efficiency droop in 280-nm AlGaN multiple-quantum-well light-emitting diodes based on carrier rate equation. Applied physics express. p. . [Online].
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Yun, J. et al. (n.d.). Analysis of efficiency droop in 280-nm AlGaN multiple-quantum-well light-emitting diodes based on carrier rate equation. Applied physics express. p. . [Online].