Characterization of thin irradiated epitaxial silicon sensors for the CMS phase II pixel upgrade. (24th February 2015)

Record Type:: Journal Article
Title:: Characterization of thin irradiated epitaxial silicon sensors for the CMS phase II pixel upgrade. (24th February 2015)
Main Title:: Characterization of thin irradiated epitaxial silicon sensors for the CMS phase II pixel upgrade
Authors:: Vignali, M. Centis
Abstract:
Is Part Of:: Journal of instrumentation. Volume 10:Number 2(2015:Feb.)
Journal:: Journal of instrumentation
Issue:: Volume 10:Number 2(2015:Feb.)
Issue Display:: Volume 10, Issue 2 (2015)
Year:: 2015
Volume:: 10
Issue:: 2
Issue Sort Value:: 2015-0010-0002-0000
Page Start:: C02040
Page End:: C02040
Publication Date:: 2015-02-24
Subjects:: Scientific apparatus and instruments -- Periodicals
502.84
Journal URLs:: http://iopscience.iop.org/1748-0221 ↗
http://ioppublishing.org/ ↗
DOI:: 10.1088/1748-0221/10/02/C02040 ↗
Languages:: English
ISSNs:: 1748-0221
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store
Ingest File:: 16289.xml