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HARVARD Citation
Zhou, L. et al. (n.d.). Stress measurement at the interface between a Si substrate and diamond-like carbon/Cr/W films by the electronic backscatter diffraction method. Applied physics express. p. . [Online].
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Zhou, L. et al. (n.d.). Stress measurement at the interface between a Si substrate and diamond-like carbon/Cr/W films by the electronic backscatter diffraction method. Applied physics express. p. . [Online].