Polarized optical sensing and band-edge transitions in Ag(In0.5Al0.5)S2. (21st January 2015)

• Record Type: Journal Article
• Authors: Ho, Ching-Hwa; Pan, Chia-Chi; Huang, Ying-Sheng
• Is Part Of: Applied physics express. Volume 8:Number 2(2015:Feb.)
• Publication Date: 2015-01-21
• Subjects: Physics -- Periodicals; Technology -- Periodicals; 621.05
• DOI: 10.7567/APEX.8.025801
• Languages: English
• ISSNs: 1882-0778

Abstract

Abstract: The polarization dependence of band-edge excitonic transitions in Ag(In0.5 Al0.5 )S2 has been characterized using polarized thermoreflectance (PTR). The polarization-sensitive behavior of the and band-edge excitons was detected and characterized by angle-dependent PTR measurements from θ = 0 [ ] to 90° [ ] with respect to the chalcopyrite crystal's needle axis. The polarized photoconductivity of Ag(In0.5 Al0.5 )S2 has also been characterized using an array of white light-emitting diodes with the polarization angles ranging from 0 to 360°. The experimental results demonstrate that Ag(In0.5 Al0.5 )S2 is a suitable material for the fabrication of polarization-sensitive photodetectors applied in the visible region.