Unifying the concepts of scattering and structure factor in ordered and disordered samples. Issue 2 (31st March 2021)

• Record Type: Journal Article
• Authors: Li, Dingning; Zhang, Kai
• Is Part Of: Journal of applied crystallography. Volume 54:Issue 2(2021)
• Page Start: 644
• Page End: 660
• Publication Date: 2021-03-31
• Subjects: scattering -- structure factors -- computation -- GPU code; Crystallography -- Periodicals; 548.05
• DOI: 10.1107/S1600576721001965
• Languages: English
• ISSNs: 0021-8898

Abstract

Abstract : This article reviews the core concepts of scattering and structure factor that are used to analyze structures of ordered and disordered samples. Simulations of scattering photography and intensity scanning of typical examples are provided, along with CPU and GPU source codes. Abstract : Scattering methods are widely used in many research areas to analyze and resolve material structures. Given its importance, a large number of textbooks are devoted to this topic. However, technical details in experiments and disconnection between explanations from different perspectives often confuse and frustrate beginner students and researchers. To create an effective learning path, the core concepts of scattering and structure factor are reviewed in this article in a self‐contained way. Classical examples of scattering photography and intensity scanning are calculated. Sample CPU and GPU codes are provided to facilitate the understanding and application of these methods.