Study on the morphology of dislocation-related etch pits on pyramidal faces of KDP crystals. Issue 13 (23rd March 2021)

• Record Type: Journal Article
• Authors: Xu, Longyun; Yu, Bo; Yu, Guangwei; Liu, Hui; Zhang, Liyuan; Li, Xianglin; Huang, Pingping; Wang, Bo; Wang, Shenglai
• Is Part Of: CrystEngComm. Volume 23:Issue 13(2021)
• Page Start: 2556
• Page End: 2562
• Publication Date: 2021-03-23
• Subjects: Crystals -- Periodicals; Crystal growth -- Periodicals; Crystallography -- Periodicals; Cristaux -- Périodiques; Cristaux -- Croissance -- Périodiques; Cristallographie -- Périodiques; 548
• DOI: 10.1039/d1ce00069a
• Languages: English
• ISSNs: 1466-8033

Abstract

Abstract : The dislocation related etch pits on pyramidal faces of KDP crystals were created by an improved wet etching method and investigated using an optical microscope and 3D confocal microscope. Abstract : The generation of etch pits with clear morphology is an important prerequisite to study dislocation structures. A mixture of water and ethanol is used to etch pyramidal faces of rapidly grown KDP crystals. Vivid etch pits on {101} faces were created by the process of etching and polishing and investigated using an optical microscope and 3D confocal microscope. The formation mechanism of dislocation-related etch pits was speculated. There exists approximately a central symmetry relation between the morphology of the dislocation-related etch pits and dislocation hillocks on the same face. The arrangement order of the inclined sectors (I′ → II′ → III′) of the dislocation-related etch pits is in accordance with that of the vicinal sectors (I → II → III) of the dislocation hillocks. The inclined sectors are composed of steps with the same orientations, [1̄ 1̄ 1], [1̄ 1 1] and [0 1 0], as the vicinal sectors on the (1 0 1) face. Due to crystal symmetry, the morphology of the dislocation-related etch pits on adjacent pyramidal faces possesses mirror symmetry. There is a central symmetry relation between the dislocation-related etch pits on the upper face and the bottom side of the same sample.