Cite
HARVARD Citation
Guagliardo, S. et al. (2021). Single-Event Latchup sensitivity: Temperature effects and the role of the collected charge. Microelectronics and reliability. p. . [Online].
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Guagliardo, S. et al. (2021). Single-Event Latchup sensitivity: Temperature effects and the role of the collected charge. Microelectronics and reliability. p. . [Online].