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HARVARD Citation
Magnani, A. et al. (2021). Thermal characterization of GaN lateral power HEMTs on Si, SOI, and poly-AlN substrates. Microelectronics and reliability. p. . [Online].
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Magnani, A. et al. (2021). Thermal characterization of GaN lateral power HEMTs on Si, SOI, and poly-AlN substrates. Microelectronics and reliability. p. . [Online].