Special Issue: IEEE International Conference on Software Testing, Validation & Verification 2018. (29th January 2021)

Record Type:: Journal Article
Title:: Special Issue: IEEE International Conference on Software Testing, Validation & Verification 2018. (29th January 2021)
Main Title:: Special Issue: IEEE International Conference on Software Testing, Validation & Verification 2018
Authors:: Feldt, Robert
Yoo, Shin
Other Names:: Feldt Robert guestEditor.
Yoo Shin guestEditor.
Abstract:
Is Part Of:: Software testing, verification & reliability. Volume 31:Number 1/2(2021)
Journal:: Software testing, verification & reliability
Issue:: Volume 31:Number 1/2(2021)
Issue Display:: Volume 31, Issue 1/2 (2021)
Year:: 2021
Volume:: 31
Issue:: 1/2
Issue Sort Value:: 2021-0031-NaN-0000
Page Start:: n/a
Page End:: n/a
Publication Date:: 2021-01-29
Subjects:: Computer software -- Testing -- Periodicals
Computer software -- Verification -- Periodicals
Computer software -- Reliability -- Periodicals
005.14
Journal URLs:: http://onlinelibrary.wiley.com/ ↗
DOI:: 10.1002/stvr.1764 ↗
Languages:: English
ISSNs:: 0960-0833
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library DSC - 8321.457500
British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store
Ingest File:: 16003.xml