Grazing Emission X‐Ray Fluorescence: Novel Concepts and Applications for Nano‐Analytics. Issue 3 (3rd November 2020)

• Record Type: Journal Article
• Authors: Baumann, Jonas; Kayser, Yves; Kanngießer, Birgit
• Is Part Of: Physica status solidi. Volume 258:Issue 3(2021)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2020-11-03
• Subjects: angle-resolved X-ray fluorescence -- area detectors -- elemental depth profiling -- nano analytics -- trace analyses; Solid state physics -- Periodicals; Solids -- Periodicals; Atomic structure -- Periodicals; 530.41
• DOI: 10.1002/pssb.202000471
• Languages: English
• ISSNs: 0370-1972

Abstract

Abstract : Angle‐resolved X‐ray fluorescence spectroscopy gives access to elemental analysis of nanoscaled materials. The two main techniques of this method are grazing incidence X‐ray fluorescence (GIXRF) and grazing emission X‐ray fluorescence (GEXRF) spectroscopy. Principles of both techniques including main applications are discussed in this Review. The main focus lies on the description of GEXRF technique and its new analytical possibilities in the nano‐world. Abstract : Structural and compositional information of nanomaterials can be obtained by grazing emission X‐ray fluorescence. This review discusses the technique, especially its scanning‐free variant, and its application to different nano‐analytical challenges.