Multidimensional analysis of excitonic spectra of monolayers of tungsten disulphide: toward computer-aided identification of structural and environmental perturbations of 2D materials. Issue 2 (2nd March 2021)

• Record Type: Journal Article
• Authors: Kolesnichenko, Pavel V; Zhang, Qianhui; Zheng, Changxi; Fuhrer, Michael S; Davis, Jeffrey A
• Is Part Of: Machine learning: science and technology. Volume 2:Issue 2(2021)
• Publication Date: 2021-03-02
• Subjects: two-dimensional materials -- principal component analysis -- hyperspectral imaging; 006.31
• DOI: 10.1088/2632-2153/abd87c
• Languages: English
• ISSNs: 2632-2153

Abstract

Abstract: Despite 2D materials holding great promise for a broad range of applications, the proliferation of devices and their fulfillment of real-life demands are still far from being realized. Experimentally obtainable samples commonly experience a wide range of perturbations (ripples and wrinkles, point and line defects, grain boundaries, strain field, doping, water intercalation, oxidation, edge reconstructions) significantly deviating the properties from idealistic models. These perturbations, in general, can be entangled or occur in groups with each group forming a complex perturbation making the interpretations of observable physical properties and the disentanglement of simultaneously acting effects a highly non-trivial task even for an experienced researcher. Here we generalise statistical correlation analysis of excitonic spectra of monolayer WS2, acquired by hyperspectral absorption and photoluminescence imaging, to a multidimensional case, and examine multidimensional correlations via unsupervised machine learning algorithms. Using principal component analysis we are able to identify four dominant components that are correlated with tensile strain, disorder induced by adsorption or intercalation of environmental molecules, multi-layer regions and charge doping, respectively. This approach has the potential to determine the local environment of WS2 monolayers or other 2D materials from simple optical measurements, and paves the way toward advanced, machine-aided, characterization of monolayer matter.