Cite
HARVARD Citation
Widiez, J. et al. (2016). 300 mm SiGe-On-Insulator Substrates with High Ge Content (70%) Fabricated Using the Smart Cut™ Technology. ECS transactions. pp. 79-88. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Widiez, J. et al. (2016). 300 mm SiGe-On-Insulator Substrates with High Ge Content (70%) Fabricated Using the Smart Cut™ Technology. ECS transactions. pp. 79-88. [Online].